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Surface Science Lab - Scanning Probe Microscopy

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Surface Science Lab

  • Surface Interfaces and Microscopy (SIM) beamlines for X-ray Absorption Spectroscopy (XAS) and Near Edge X-ray Absorption Fine Structure (NEXAFS) at their Photon Emission Electron Microscopy (PEEM) and their X-ray Circular Magnetic Dichroism (XMCD) Endstations.

  • The PhotoEmission and Atomic Resolution Laboratory (PEARL) with their X-ray Photoelectron Diffraction and Angle Resolved Photoelectron Spectroscopy (ARPES) / local probe capabilities.

  • The  X-ray absorption spectroscopy at high magnetic field and low temperature (XTREME) Beamline for their  X-ray Absorption Spectroscopy (XAS) and their X-ray Circular Magnetic Dichroism (XMCD) Endstations.

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Scanning Probe Microscopy

  • Bruker Nanoscope Multimode

  • Bruker Dimension Icon

Contact

Laboratory for Micro-
and Nanotechnology
Paul Scherrer Institut
5232 Villigen PSI
Switzerland

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Prof. Thomas Jung
E-mail: thomas.jung@psi.ch

T: +41 56 310 4518

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